As already done for NOR chips, if device ESIZE and ENVSECTORS static
configurations are both zero, then autodetect them at runtime.
Cc: Joe Hershberger <joe.hershberger@ni.com>
cc: Stefan Agner <stefan@agner.ch>
cc: Rasmus Villemoes <rasmus.villemoes@prevas.dk>
Signed-off-by: Anthony Loiseau <anthony.loiseau@allcircuits.com>
this environment instance. On NAND this is used to limit the range
within which bad blocks are skipped, on NOR it is not used.
+If DEVICEx_ESIZE and DEVICEx_ENVSECTORS are both zero, then a runtime
+detection is attempted for NOR and NAND mtd types.
+
To prevent losing changes to the environment and to prevent confusing the MTD
drivers, a lock file at /run/fw_printenv.lock is used to serialize access
to the environment.
}
DEVTYPE(dev) = mtdinfo.type;
if (DEVESIZE(dev) == 0 && ENVSECTORS(dev) == 0 &&
- mtdinfo.type == MTD_NORFLASH)
- DEVESIZE(dev) = mtdinfo.erasesize;
+ mtdinfo.erasesize > 0) {
+ if (mtdinfo.type == MTD_NORFLASH)
+ DEVESIZE(dev) = mtdinfo.erasesize;
+ else if (mtdinfo.type == MTD_NANDFLASH) {
+ DEVESIZE(dev) = mtdinfo.erasesize;
+ ENVSECTORS(dev) =
+ mtdinfo.size / mtdinfo.erasesize;
+ }
+ }
if (DEVESIZE(dev) == 0)
/* Assume the erase size is the same as the env-size */
DEVESIZE(dev) = ENVSIZE(dev);