mtd: nand: Mark the BBT as scanned prior to calling scan_bbt again

Commit 35c204d8a9d0 (nand: reinstate lazy bad block scanning)
broke NAND_BBT_USE_FLASH feature.

Its git-log claimed that it reinstated the change as by commit
fb49454b1b6c ("nand: reinstate lazy bad block scanning"), but it moved
"chip->options |= NAND_BBT_SCANNED" below "chip->scan_bbt(mtd);".

It causes recursion if scan_bbt does not find a flash based BBT
and tries to write one, and the attempt to erase the BBT area
causes a bad block check.

Reinstate commit ff49ea8977b5 (NAND: Mark the BBT as scanned prior to
calling scan_bbt.).

Signed-off-by: Masahiro Yamada <yamada.m@jp.panasonic.com>
Cc: Rostislav Lisovy <lisovy@merica.cz>
Cc: Heiko Schocher <hs@denx.de>
Cc: Scott Wood <scottwood@freescale.com>

diff --git a/drivers/mtd/nand/nand_base.c b/drivers/mtd/nand/nand_base.c
index d04c7ea0ae7c66afca1167cc5f9aac78cfa21197..eaa4be15069c5ee85cf95ff125b8159013c09574 100644 (file)
--- a/drivers/mtd/nand/nand_base.c
+++ b/drivers/mtd/nand/nand_base.c
@@ -635,8 +635,8 @@ static int nand_block_checkbad(struct mtd_info *mtd, loff_t ofs, int getchip,
        struct nand_chip *chip = mtd->priv;
 
        if (!(chip->options & NAND_BBT_SCANNED)) {
-               chip->scan_bbt(mtd);
                chip->options |= NAND_BBT_SCANNED;
+               chip->scan_bbt(mtd);
        }
 
        if (!chip->bbt)