From: Jagan Teki Date: Thu, 17 Mar 2016 06:53:18 +0000 (+0530) Subject: doc: driver-model: Update dm tests run using test.py X-Git-Url: http://git.dujemihanovic.xyz/?a=commitdiff_plain;h=e57f9c8eef9ea44b3dd079375a64fef727a8fbcb;p=u-boot.git doc: driver-model: Update dm tests run using test.py Since all the tests are implemented in pytest infrastructure, So update the dm tests with the same instead of ./test/dm/test-dm.sh Cc: Tom Rini Cc: Simon Glass Acked-by: Stephen Warren Signed-off-by: Jagan Teki --- diff --git a/doc/driver-model/README.txt b/doc/driver-model/README.txt index b891e8459d..7a24552560 100644 --- a/doc/driver-model/README.txt +++ b/doc/driver-model/README.txt @@ -90,110 +90,137 @@ The intent with driver model is that the core portion has 100% test coverage in sandbox, and every uclass has its own test. As a move towards this, tests are provided in test/dm. To run them, try: - ./test/dm/test-dm.sh + ./test/py/test.py --bd sandbox --build -k ut_dm -v You should see something like this: - <...U-Boot banner...> - Running 53 driver model tests - Test: dm_test_autobind - Test: dm_test_autoprobe - Test: dm_test_bus_child_post_bind - Test: dm_test_bus_child_post_bind_uclass - Test: dm_test_bus_child_pre_probe_uclass - Test: dm_test_bus_children - Device 'c-test@0': seq 0 is in use by 'd-test' - Device 'c-test@1': seq 1 is in use by 'f-test' - Test: dm_test_bus_children_funcs - Test: dm_test_bus_children_iterators - Test: dm_test_bus_parent_data - Test: dm_test_bus_parent_data_uclass - Test: dm_test_bus_parent_ops - Test: dm_test_bus_parent_platdata - Test: dm_test_bus_parent_platdata_uclass - Test: dm_test_children - Test: dm_test_device_get_uclass_id - Test: dm_test_eth - Using eth@10002000 device - Using eth@10003000 device - Using eth@10004000 device - Test: dm_test_eth_alias - Using eth@10002000 device - Using eth@10004000 device - Using eth@10002000 device - Using eth@10003000 device - Test: dm_test_eth_prime - Using eth@10003000 device - Using eth@10002000 device - Test: dm_test_eth_rotate - - Error: eth@10004000 address not set. - - Error: eth@10004000 address not set. - Using eth@10002000 device - - Error: eth@10004000 address not set. - - Error: eth@10004000 address not set. - Using eth@10004000 device - Test: dm_test_fdt - Test: dm_test_fdt_offset - Test: dm_test_fdt_pre_reloc - Test: dm_test_fdt_uclass_seq - Test: dm_test_gpio - extra-gpios: get_value: error: gpio b5 not reserved - Test: dm_test_gpio_anon - Test: dm_test_gpio_copy - Test: dm_test_gpio_leak - extra-gpios: get_value: error: gpio b5 not reserved - Test: dm_test_gpio_phandles - Test: dm_test_gpio_requestf - Test: dm_test_i2c_bytewise - Test: dm_test_i2c_find - Test: dm_test_i2c_offset - Test: dm_test_i2c_offset_len - Test: dm_test_i2c_probe_empty - Test: dm_test_i2c_read_write - Test: dm_test_i2c_speed - Test: dm_test_leak - Test: dm_test_lifecycle - Test: dm_test_net_retry - Using eth@10004000 device - Using eth@10002000 device - Using eth@10004000 device - Test: dm_test_operations - Test: dm_test_ordering - Test: dm_test_pci_base - Test: dm_test_pci_swapcase - Test: dm_test_platdata - Test: dm_test_pre_reloc - Test: dm_test_remove - Test: dm_test_spi_find - Invalid chip select 0:0 (err=-19) - SF: Failed to get idcodes - SF: Detected M25P16 with page size 256 Bytes, erase size 64 KiB, total 2 MiB - Test: dm_test_spi_flash - 2097152 bytes written in 0 ms - SF: Detected M25P16 with page size 256 Bytes, erase size 64 KiB, total 2 MiB - SPI flash test: - 0 erase: 0 ticks, 65536000 KiB/s 524288.000 Mbps - 1 check: 0 ticks, 65536000 KiB/s 524288.000 Mbps - 2 write: 0 ticks, 65536000 KiB/s 524288.000 Mbps - 3 read: 0 ticks, 65536000 KiB/s 524288.000 Mbps - Test passed - 0 erase: 0 ticks, 65536000 KiB/s 524288.000 Mbps - 1 check: 0 ticks, 65536000 KiB/s 524288.000 Mbps - 2 write: 0 ticks, 65536000 KiB/s 524288.000 Mbps - 3 read: 0 ticks, 65536000 KiB/s 524288.000 Mbps - Test: dm_test_spi_xfer - SF: Detected M25P16 with page size 256 Bytes, erase size 64 KiB, total 2 MiB - Test: dm_test_uclass - Test: dm_test_uclass_before_ready - Test: dm_test_usb_base - Test: dm_test_usb_flash - USB-1: scanning bus 1 for devices... 2 USB Device(s) found - Failures: 0 - +(venv)$ ./test/py/test.py --bd sandbox --build -k ut_dm -v ++make O=/root/u-boot/build-sandbox -s sandbox_defconfig ++make O=/root/u-boot/build-sandbox -s -j8 +============================= test session starts ============================== +platform linux2 -- Python 2.7.5, pytest-2.9.0, py-1.4.31, pluggy-0.3.1 -- /root/u-boot/venv/bin/python +cachedir: .cache +rootdir: /root/u-boot, inifile: +collected 199 items + +test/py/tests/test_ut.py::test_ut_dm_init PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_adc_bind] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_adc_multi_channel_conversion] PASSED +test/py/tests/test_ut.py::test_ut[ut_dm_adc_multi_channel_shot] 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